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SPEMS 1xxxx series
Semiconductor Failure Analysis
Sensitivity is the key for detection of the faint emissions in Failure Analysis of modern ICs. Recognizing this critical element, sensitivity is an essential requirement in SEMICAPS's Emission Microscope design philosophy. SEMICAPS provides this crucial sensitivity with SPEMS 1XXX series by supplying high sensitive InGaAs Cameras and SIL lenses, which provide unmatched sensitivity in today's market for Photon Emission Microscopes. Furthermore, flexible upgrade possibilities to a SOM system guarantees a sound investment for future requirements.