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SOM 2000 and 3000
Semiconductor Failure Analysis
The 2000 and 3000 SOMs are multi-laser Scanning Optical Microscope Systems for Tester-based Failure Analysis. They combine the SOM 1XXX capabilities with the possibility of a direct or inverted tester docking and provide a Multi-technique platform for advanced laser induced applications like OBIC, RIL, SCOBIC, LIVA, TIVA, SEI, TBIP, OBIRCH or SDL.